@conference{56421,
  author = {Nanying Yang and Jose Ortiz and Tam Duong and Allen Hefner and Kathleen Meehan},
  title = {Modeling the Inter-Electrode Capacitances of Si CoolMOSTM Transistors for Circuit Simulation in High Efficiency Power Systems},
  year = {2010},
  month = {2010-09-12},
  publisher = {Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE) Conference 2010, Atlanta, GA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905983},
  language = {en},
}