@conference{4741,
  author = {Erik Secula and David Seiler},
  title = {Frontiers of Characterization and Metrology for Nanoelectronics: 2015},
  year = {2015},
  month = {2015-04-14},
  publisher = {Frontiers of Characterization and Metrology for Nanoelectronics: 2015, Dresden, -1},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918591},
  language = {en},
}