@conference{42141,
  author = {Ndubuisi Orji and Ronald Dixson and Aaron Cordes and Benjamin Bunday and John Allgair},
  title = {Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment},
  year = {2009},
  number = {7405},
  month = {2009-09-25},
  publisher = {Proceedings of SPIE Volume 7042 -Instrumentation, Metrology, and Standards for Nanomanufacturing III, San Diego, CA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903286},
  language = {en},
}