@article{40696,
  author = {Nicholas Ritchie and Dale Newbury and Abigail Lindstrom},
  title = {Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector},
  year = {2011},
  month = {2011-12-01},
  publisher = {Microscopy and Microanalysis},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907003},
  language = {en},
}