@conference{40631,
  author = {Jason Ryan and Lan Wei and Jason Campbell and Richard Southwick and Kin Cheung and Anthony Oates and John Suehle and Phillip Wong},
  title = {Circuit-Aware Device Reliability Criteria Methodology},
  year = {2011},
  month = {2011-09-12},
  publisher = {Proceedings of the European Solid State Device Research Conference, Helsinki, -1},
  language = {en},
}