@misc{32511,
  author = {Jan Obrzut and Jason Ferguson and MIchael Azarian},
  title = {Power Density Rating for Embedded Resistors},
  year = {2012},
  number = {IPC-TM-650},
  month = {2012-07-09},
  publisher = {IPC D-54 Embedded Devices Test Methods Subcommittee},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905275},
  language = {en},
}