@conference{32296, author = {Jason Ryan and Richard Southwick and Jason Campbell and Kin Cheung and Chadwin Young and John Suehle}, title = {Experimentally Based Methodology for Charge Pumping Bulk Defect Trapping Correction}, year = {2011}, month = {2011-12-15}, publisher = {International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA}, language = {en}, }