@conference{32291,
  author = {Jason Ryan and Lan Wei and Jason Campbell and Richard Southwick and Kin Cheung and Tony Oates and Phillip Wong and John Suehle},
  title = {When Does a Circuit Really Fail?},
  year = {2011},
  month = {2011-12-15},
  publisher = {International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA},
  language = {en},
}