@conference{32101,
  author = {Michael Postek and Andras Vladar and William Keery and Michael Bishop and Benjamin Bunday and John Allgair},
  title = {NEW Scanning Electron Microscope Magnification Calibration Reference Material (RM) 8820},
  year = {2010},
  number = {7729},
  month = {2010-08-19},
  publisher = {Proceedings of SPIE, Monterey, CA},
  language = {en},
}