@article{31996,
  author = {Jason Ryan and Richard Southwick and Jason Campbell and Kin Cheung and John Suehle},
  title = {On the Contribution of Bulk Defects on Charge Pumping Current},
  year = {2012},
  month = {2012-10-01},
  publisher = {IEEE Transactions on Electron Devices},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911823},
  language = {en},
}