@conference{31306,
  author = {Ronald Dixson and Boon and Craig McGray and Ndubuisi Orji and Jon Geist},
  title = {Progress on CD-AFM tip width calibration standards},
  year = {2011},
  number = {8378},
  month = {2011-05-10},
  publisher = {Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, Baltimore, MD},
  language = {en},
}