@article{26211,
  author = {Chukwudi Okoro and Pavel Kabos and Jan Obrzut and Klaus Hummler and Yaw Obeng},
  title = {Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals},
  year = {2013},
  number = {60},
  month = {2013-06-01},
  publisher = {IEEE Transactions on Electron Devices},
  doi = {https://doi.org/10.1109/TED.2013.2257791},
  language = {en},
}