@conference{259601,
  author = {Raghu Kacker and David Kuhn},
  title = {Estimating t-way Fault Profile Evolution During Testing},
  year = {2016},
  month = {2016-06-10},
  publisher = {Proceedings of IEEE International Conference on Software Testing, Verification and Validation
ICST 2017, Tokyo, -1},
  doi = {https://doi.org/10.1109/COMPSAC.2016.110},
  language = {en},
}