@conference{25656,
  author = {Joseph Kopanski and Muhammad Afridi and Chong Jiang and Michael Lorek and Timothy Kohler and Curt Richter},
  title = {Charge-Based Capacitance Measurements Circuits for Interface With Atomic Force Microscope Probes},
  year = {2013},
  month = {2013-03-25},
  publisher = {2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics , Gaithersburg, MD},
  language = {en},
}