@conference{253646,
  author = {John Sieber},
  title = {How to Use and How Not to Use Certified Reference Materials in Industrial Chemical Metrology Laboratories},
  year = {2020},
  number = {63},
  month = {2020-03-17},
  publisher = {Advances in X-Ray Analysis, Lombard, IL},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928700},
  language = {en},
}