@conference{252541,
  author = {Winnie Wong-Ng and Joshua Martin and Nathan Lowhorn and Makoto Otani and Evan Thomas and Martin Green and Jason Hattrick-Simpers and Yonggao Yan and Thanh Tran and Jihui Yang},
  title = {Recent Developments in Thermoelectric Metrology at NIST},
  year = {2010},
  number = {221},
  month = {2010-07-10},
  publisher = {International Symposium on Advanced Dielectric Materials and Electronic Devices, Pittsburgh, PA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903945},
  language = {en},
}