@misc{247646,
  author = {Enrico Lucon and Raymond Santoyo},
  title = {Charpy Interlaboratory Comparison between NIST and the Beijing Institute of Metrology (BIM)},
  year = {2019},
  month = {2019-09-12},
  publisher = {Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.TN.2061},
  language = {en},
}