@article{247491,
  author = {John Sieber and Adam Mortensen},
  title = {VALIDATION AND TRACEABILITY OF XRF AND SEM-EDS ELEMENTAL ANALYSIS RESULTS FOR SOLDER IN HIGH-RELIABILITY APPLICATIONS},
  year = {2014},
  number = {43},
  month = {2014-09-09},
  publisher = {X-Ray Spectrometry},
  doi = {https://doi.org/10.1002/xrs.2548},
  language = {en},
}