@conference{24156,
  author = {Jason Ryan and Brad Bittel and Pat Lenahan and Jody Fronheiser and Aivars Lelis},
  title = {Observation of Interface/Near Interface Defects in 4H SiC MOSFETs With a New Electrically Detected Magnetic Resonance Technique},
  year = {2013},
  month = {2013-01-01},
  publisher = {Proceedings of the International Conference on Silicon Carbide and Related Materials, Cleveland, OH},
  language = {en},
}