@conference{24146,
  author = {Jason Ryan and Jason Campbell and Kin Cheung and John Suehle and Richard Southwick and Anthony Oates},
  title = {Reliability Monitoring For Highly Leaky Devices},
  year = {2013},
  month = {2013-05-31},
  publisher = {Proceedings of the IEEE International Reliability Physics Symposium, Monterey, CA},
  language = {en},
}