@conference{24136,
  author = {Jason Campbell and Kin Cheung and Anthony Oates},
  title = {The Series Resistance Component of Hot Carrier Degradation in Ultra-Short Channel Devices},
  year = {2013},
  month = {2013-04-22},
  publisher = {2013 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA), Hsinchu, -1},
  language = {en},
}