@conference{240606,
  author = {Joseph Kopanski and Lin You and Yaw Obeng},
  title = {Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging},
  year = {2018},
  month = {2018-03-05},
  publisher = {APS March Meeting 2018 Scientific Program, Los Angeles, CA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924700},
  language = {en},
}