@conference{234896,
  author = {Dean Jarrett and Takehiko Oe and Nobu Kaneko and Shamith Payagala},
  title = {10 T? and 100 T? Resistance Comparison between NIST and AIST},
  year = {2018},
  month = {2018-07-09},
  publisher = {CPEM 2018 Conference Digest, Paris, -1},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925143},
  language = {en},
}