@misc{233306,
  author = {Brian Weiss and Donnie Alonzo and Steve Weinman},
  title = {Summary Report on a Workshop on Advanced Monitoring, Diagnostics, and Prognostics for Manufacturing Operations},
  year = {2017},
  month = {2017-11-13},
  publisher = {Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.AMS.100-13},
  language = {en},
}