@conference{225931,
  author = {Erik Secula and David Seiler},
  title = {Frontiers of Characterization and Metrology for Nanoelectronics: 2017},
  year = {2017},
  month = {2017-03-20},
  publisher = {Frontiers of Characterization and Metrology for Nanoelectronics: 2017, Monterey, CA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923057},
  language = {en},
}