@misc{222571,
  author = {James Randa},
  title = {Detailed Study of Uncertainties in On-Wafer Transistor Noise-Parameter Measurements},
  year = {2016},
  month = {2016-10-24},
  publisher = {Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.TN.1939},
  language = {en},
}