@article{218106,
  author = {Yaw Obeng and Chukwudi Okoro and Papa Amoah and Victor Vartanian},
  title = {Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials},
  year = {2016},
  number = {5},
  month = {2016-08-18},
  publisher = {ECS Journal of Solid State Science and Technology},
  doi = {https://doi.org/10.1149/2.0411609jss},
  language = {en},
}