@conference{216641,
  author = {Robert Keller and David Read and Roey Shaviv and Greg Harm and Sangita Kumari},
  title = {Electromigration of Cu Interconnects Under AC, Pulsed-DC and DC Test Conditions - Ramifications on Accelerated Testing},
  year = {2011},
  month = {2011-04-10},
  publisher = {2011 IEEE International Reliability Physics Symposium, Monterey, CA},
  doi = {https://doi.org/10.1109/IRPS.2011.5784570},
  language = {en},
}