@conference{215311,
  author = {Robert Keller and Mark Strus and Ann Chiaramonti and David Read and Younglae Kim and Yung Jung},
  title = {Reliability Testing of Advanced Interconnect Materials},
  year = {2011},
  month = {2011-11-10},
  publisher = {AIP Conference Proceedings (volume TBD), Woodbury, NY},
  doi = {https://doi.org/10.1063/1.3657900},
  language = {en},
}