@conference{213961,
  author = {Jeffrey Jargon and Chihyun Cho and Dylan Williams and Paul Hale},
  title = {Physical Models for 2.4 mm and 3.5 mm Coaxial VNA Calibration Kits Developed within the NIST Microwave Uncertainty Framework},
  year = {2015},
  month = {2015-05-22},
  publisher = {85th ARFTG Microwave Measurement Symposium, Phoenix, AZ},
  doi = {https://doi.org/10.1109/ARFTG.2015.7162913},
  language = {en},
}