@conference{202831,
  author = {Nhan Nguyen and Oleg Kirillov and Hao Xiong and John Suehle},
  title = {Internal Photoemission Spectroscopy of Metal Gate/High-k/ Semiconductor Interfaces},
  year = {2007},
  month = {2007-09-30},
  publisher = {Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32724},
  language = {en},
}