@conference{195966,
  author = {Harry Schafft},
  title = {Interconnect Reliability Test Chip NIST 36: For Development of Measurement Tools & Standards},
  year = {1999},
  month = {1999-12-31},
  publisher = {1998 IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA},
  language = {en},
}