@conference{195831,
  author = {David Blackburn},
  title = {Failure Mechanisms and Nondestructive Testing of Power Bipolar and MOS-Gated Transistors},
  year = {1992},
  month = {1992-09-01},
  publisher = {Proc., EPE - MADEP '91 Symposium on Materials and Devices for Power Electronics, Florence, IT},
  language = {en},
}