@conference{194071,
  author = {Harry Schafft},
  title = {Reliability Test Chips: NIST 33 & NIST 34 for JEDEC Inter-Laboratory Experiments and More},
  year = {1998},
  month = {1998-12-31},
  publisher = {Proc.,  1997 IEEE International Integrated Reliability Workshop, Lake Tahoe, CA},
  language = {en},
}