@conference{191266,
  author = {John Dagata},
  title = {Evaluation of Scanning Maxwell-Stress Microscopy for SPM-Based Nanoelectronics},
  year = {1997},
  month = {1997-09-01},
  publisher = {Program of the 4th Industrial Applications of Scanned Probe Microscopy; NIST, Gaithersburg, MD, 1997; and Nanotechnology 8: A3-A9, Special Issue, September 1997, Gaithersburg, MD},
  language = {en},
}