@inbook{18551,
  author = {Jason Campbell and P. Lenahan},
  title = {Atomic Scale Defects Associated with the Negative Bias Temperature Instability},
  year = {2014},
  month = {2014-01-01},
  publisher = {Bias Temperature Instability for Devices and Circuits, Springer Science+Business Media LLC, New York, NY},
  language = {en},
}