@conference{18536,
  author = {Zakariae Chbili and Kin Cheung and Jason Campbell and John Suehle and D. Ioannou and Aivars Lelis and Sei-Hyung Ryu},
  title = {Unusual Bias Temperature Instability in SiC DMOSFET},
  year = {2014},
  month = {2014-03-03},
  publisher = {International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, CA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914921},
  language = {en},
}