@conference{183351,
  author = {John Small and David Bright},
  title = {Comparison of High- and Low-Voltage X-Ray Mapping of an Electronic Device},
  year = {2001},
  number = {550},
  month = {2001-02-01},
  publisher = {Characterization and Metrology for ULSI Technology, International Conference | | AIP Conference Proceedings #550 Characterization and Metrology for ULSI Technology 2000: International Conference | AIP},
  language = {en},
}