@conference{18231,
  author = {Jack Stone and Patrick Egan and Jay Hendricks and Gregory Strouse and Douglas Olson and Jacob Ricker and Gregory Scace},
  title = {Picometer metrology for precise measurement of refractive index, pressure, and temperature},
  year = {2013},
  month = {2013-07-14},
  publisher = { NCSLI 2013 Workshop & Symposium, Proceedings, Nashville, TN},
  language = {en},
}