@conference{152766,
  author = {YaShian Li-Baboud and Eric Simmon and Yaw Obeng},
  title = {Identity management standards for product life cycle of electronic parts},
  year = {2008},
  month = {2008-09-10},
  publisher = {Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts, College Park, MD},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33159},
  language = {en},
}