@article{150036,
  author = {Curt Richter and Hao Xiong and Xiaoxiao Zhu and Wenyong Wang and Vincent Stanford and Woong-Ki Hong and Takhee Lee and D. Ioannou and Qiliang Li},
  title = {Metrology for the Electrical Characterization of Semiconductor Nanowires},
  year = {2008},
  number = {55},
  month = {2008-11-01},
  publisher = {IEEE Transactions on Electron Devices},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33073},
  language = {en},
}