@article{145121,
  author = {Zachary Levine and A Kalukin and M Kuhn and S Frigo and I McNulty and C Retsch and Ying-Ju Wang and Uwe Arp and Thomas Lucatorto and B Ravel and Charles Tarrio},
  title = {Microtomography of an integrated circuit interconnect with an electromigration void},
  year = {2000},
  number = {87},
  month = {2000-01-01},
  publisher = {Journal of Applied Physics},
  language = {en},
}