@conference{conference,
  author = {Cooper Voigt and Stephen Moxim and Jason Campbell and Akin Akturk and Jason Ryan},
  title = {Defects involved in TDDB-stressed SiC MOSFET},
  year = {2026},
  month = {2026-04-28 04:04:00},
  publisher = {2025 IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=960620},
  language = {en},
}