@conference{conference,
  author = {Jay Hendricks and Barbara Goldstein and Alexandra Artusio-Glimpse and Christopher Holloway and MATTHEW SIMONS and Nikunjkumar Prajapati and Andrew Rotunno and Samuel Berweger and Kaleb Campbell and Maitreyi Jayaseelan and Nikolai Klimov and Zeeshan Ahmed and Daniel Barker and Stephen Eckel and James Fedchak and Jacob Ricker and Kevin Douglass and Tobias Herman and Michal Chojnacky and Julia Scherschligt and Stephan Schlamminger and Leon Chao and Zane Comden and John-Edward Draganov and Thinh Bui},
  title = {One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI},
  year = {2023},
  month = {2023-05-08 04:05:00},
  publisher = {SMSI 2023 Conference Proceedings, Nuremburg, DE},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936744},
  doi = {https://doi.org/10.5162/SMSI2023/C1.1},
  language = {en},
}