@article{1342961,
  author = {Albert Rigosi and Hansjorg Scherer and Mathieu Taupin and Luca Callegaro and Hans He and Susmit Kumar and Ali Eichenberger and Mattias Kruskopf and Yanfei Yang and Martina Marzano and Stephen Giblin and Sergiy Rozhko and Takehiko Oe and Dong-Hun Chae and Pierre Gournay},
  title = {Companion Guide to the Revised Technical Guidelines for Reliable dc Measurements of the Quantized Hall Resistance for Graphene-Based Devices},
  year = {2026},
  month = {2026-06-02 04:06:00},
  publisher = {Metrologia},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961514},
  language = {en},
}