@conference{134281,
  author = {Jason Campbell and Kin Cheung and John Suehle and A Oates},
  title = {Electron Trapping: An Unexpected Mechanism of NBTI and Its Implications},
  year = {2008},
  month = {2008-06-17},
  publisher = {Proceedings of the 2008 Symposium on VLSI Technology, Honolulu, HI},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32983},
  language = {en},
}