@conference{134246,
  author = {Hao Xiong and Dawei Heh and Shuo Yang and Moshe Gurfinkel and Gennadi Bersuker and D. Ioannou and Curt Richter and Kin Cheung and John Suehle},
  title = {STRESS-INDUCED DEFECT GENERATION IN HFO2/SIO2 STACKS OBSERVED BY USING CHARGE PUMPING AND LOW FREQUENCY NOISE MEASUREMENTS},
  year = {2008},
  month = {2008-04-30},
  publisher = {IEEE International Reliability Physics Symposium Proceedings, Phoenix, AZ},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32962},
  language = {en},
}