@article{1342456,
  author = {Pragya Shrestha and Jason Campbell and Jhih-Wei Chen and Mau-Chung Frank Chang},
  title = {Impact of Measurement Setup on Cryogenic CMOS FET Characterization},
  year = {2026},
  number = {47},
  month = {2026-03-31 04:03:00},
  publisher = {IEEE Electron Device Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961170},
  doi = {https://doi.org/10.1109/LED.2026.3679453},
  language = {en},
}