@conference{1338551,
  author = {Jason Ryan and Richard Southwick and Jason Campbell and Kin Cheung and John Suehle},
  title = {Frequency Dependent Charge Pumping -- A Defect Depth Profiling Tool?},
  year = {2013},
  month = {2013-01-31 00:01:00},
  publisher = {IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US},
  language = {en},
}