@inbook{1338136,
  author = {Jason Campbell and Patrick Lenahan},
  title = {Atomic Scale Defects Associated with the Negative Bias Temperature Instability},
  year = {2014},
  month = {2014-01-01 00:01:00},
  publisher = {Bias Temperature Instability for Devices and Circuits, Springer Science+Business Media LLC, New York, NY},
  language = {en},
}